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Summary of 11/17/24 22:04 GMT:>> Show Compact View
2/16/23 7:58 GMT
UV-1700 Spectrophotometry Lab Dual Beam Optical System

UV-1700 Advantages: 1. Dual-light path, dual-beam optical system, higher instrument resolution, lower stray light, stronger stability, reliability, more accurate analysis; 2. Using a 6-inch LED dazzling color LCD display, clear display, complete information 3. The host machine can independently complete the photometric measurement, quantitative measurement, spectral scanning, kinetic analysis, DNA / protein testing, multi-wavelength testing and data printing and other functions; 4. The original imported detector, deuterium lamp, tungsten lamp and other key components to ensure the durability of the instrument 5. Professional analysis software, which can realize photometry, quantitative measurement, spectral scanning, kinetic analysis, DNA / protein testing, multi- wavelength testing, data printing and other functions; 6. It is convenient to use automatic eight joint tank, trace scale tray, constant thermostatic automatic sampler, reflective accessories, integral ball and other accessories, which expands the use scope and application field of the instrument. UV-1700 Spectrophotometry Lab Dual Beam Optical System 0 Exhibition: UV-1700 Spectrophotometry Lab Dual Beam Optical System 1 Technical Specifications Wavelength Range :190~1100nm Band Width :2nm (0.5nm, 1nm, 4nm, 5nm optional,or 0.5 , 1, 2, 4nm adjustable) Wavelength Accuracy :±0.3nm Wavelength Repeatability: ≤0.1nm Photometric Accuracy :±0.3% τ(0-100%τ) ±0.002A(0~0.5A) ±0.003A(0.5A~1A) Photometric Repeatability: 0.15% τ(0-100%τ) ±0.001A(0~0.5A) ±0.0015A(0.5A ~1A) Stray Light: ≤0.03% τ (220nm NaI,340nm NaNO2) Stability : 0.0005A/h@500nm Photometric Mode :T,A,C,E Wavelength Setting :Automatic Photometric Display Range: -4~4A Display Mode: 6 Inches hight Light blue LCD Detector :Import Silicon Photodiode Light Source: Import Deuterium Lamp & Tungsten Halogen Lamp Power Requirement: AC 220V/50Hz 110V/60Hz Power: 120W Dimensions(L*W*H): 560×450×230mm Weight :28kg Our Factory: UV-1700 Spectrophotometry Lab Dual Beam Optical System 2 Character: LSI design greatly improves the scalability and reliability of the system Improved optimization of the optical design , import source and receiver system created a high performance and high reliability Rich measurement methods , with a wavelength scan , time scan , multi- wavelength determination , multi-order derivative determination (optional ) , dual-wavelength , three-wavelength (optional ) DNA protein measurements (optional ) , and other measurement methods to meet different measurement requirements , and can be displayed directly on a 6- inch screen Based on user requirements optional hole rack , manual four with stand , manual Eighth rack , automatic Eighth frame, glass stand , test tube rack , 1cm colorimetric frame , 5cm colorimetric frame , 10cm colorimetric racks Measurement data can be output through the printer with USB interface Can be powered down to save the measurement parameters and data , user-friendly Certificate: UV-1700 Spectrophotometry Lab Dual Beam Optical System 3 UV-1700 Spectrophotometry Lab Dual Beam Optical System 4

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Ms. Jane
86-010-63014082
86-010-63132725
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Macylab Instruments Inc.
A-711, Haige International Building, Xuanwumen, Xicheng District, Beijing China
Beijing 100000
China
2/10/23 7:44 GMT
Neware 5V10mA Battery Tester For Coin Cell

1:Neware 5V10mA battery tester designed for high performance coin cell testing of battery materials research at electrochemistry and pouch cell testing. 2:5V10mA has 8 channels and each of channel is independent that user could set different charge discharge programs at different channels at the same time. 3:Neware BTSDA offerred to analysis testing data and operate curve. Key Technology Parameters: Voltage Range:-5V~5V Lowest Discharge Voltage:-5V Voltage Testing Precision:±0.05% Current Range 1:5uA~1mA; Current Range 2:1mA~5mA; Current Range 3:5mA~10mA Current Testing Precision:±0.05% Primary Applications: Pouch Cell Testing Button Cell Testing Three-electrode Testing Super-capacitor Testing Electrochemistry Research Battery Materials Research Electrochemical Research and Development Key Features: dQ/dV Curve Cycle Life Testing Energy Density Testing Specific Capacity Testing Charge Discharge Testing

Minimum Order: 1 bags

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Min Chen


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Neware Technology Limited
22C,YHC Tower, No.1 Sheung Yuet Road, Kowloon Bay
HongKong
China
2/10/23 7:44 GMT
BTS5V6A Neware Battery Tester

Product Introduction: 1.Neware pouch cell battery tester provides most applications in cylindrical cell and pouch cell capacity Testing.It based on charging discharging battery under different modes. It controlled by the Monitor Software installed at computer. Monitor software to edit testing program and BTSDA to analysis tested data. 2.Every unit pouch cell battery tester has 8 channels and could be installed Max.10 units on a rack make up 80 channels.Each of channel could work independently with different charge discharge program at same time. 3.Neware battery tester has constant current charge,constant voltage charge,constant current and voltage charge,constant power charge,constant current discharge,constant voltage discharge,constant power discharge,constant resistance discharge. 4.5V6A battery tester widely used in Pouch Cell Testing,Mobile Battery Testing,Cylindrical Cell Testing,Production Line Testing,Super-capacitor Testing and Lab Battery Materials Research. 5.The pouch cell battery tester is suitable for all kinds rechargeable batteries such as lithium battery, NI-MH battery, Zn-Mn watch battery and so on. Key Technology Parameters: Voltage Range:-5V~5V Lowest Discharge Voltage:1.5V Voltage Testing Precision:±0.05% Current Range 1:0.5mA~100mA; Current Range 2:100mA~3A; Current Range 3:3A~6A Current Testing Precision:±0.05% Primary Applications: Pouch Cell Testing Mobile Battery Testing Cylindrical Cell Testing Production Line Testing Super-capacitor Testing Lab Battery Materials Research Key Features: DCIR Testing Pulse Testing Capacity Testing Cycle Life Testing Testing Data Analysis Charge/Discharge Testing

Minimum Order: 1 bags

Contact:
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Email:
Min Chen
+86-13728762680
+86-755-83109966
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Neware Technology Limited
22C,YHC Tower, No.1 Sheung Yuet Road, Kowloon Bay
HongKong
China
2/10/23 7:44 GMT
BTS5V5A Neware Battery Testing System

1.Neware BTS5V5A battery testing system provides most applications in cylindrical cell and pouch cell Testing,widely used in battery research institutes, universities and laboratories of battery,mobile battery manufactures.Many international great mobile manufacturers are using. 2.BTS5V5A have 2 channels,4 channels and 8 channels these three models.The testing precision is 0.02%FS for voltage and current,4 current testing ranges,100uS quick response time,1000Hz data recording frequency, and 400uS pulse width,it widely used on mobile batteries to do GSM testing, Electrochemical Research and Development. and could be installed Max.10 units on a rack make up 80 channels.Each of channel could work independently with different charge discharge program at same time. 3.Neware battery testing equipment has constant current charge,constant voltage charge,constant current and voltage charge,constant power charge,constant current discharge,constant voltage discharge,constant power discharge,constant resistance discharge. 4.The Neware battery testing system is suitable for all kinds rechargeable batteries such as lithium battery, NI-MH battery, Zn-Mn watch battery and so on. Key Technology Parameters: Voltage Range:-5V~5V Lowest Discharge Voltage:0.7V Voltage Testing Precision:±0.02% Multi-current Range: Range 1: 30nA - 150uA Range 2: 150uA - 5mA Range 3: 5mA - 150mA Range 4: 150mA - 5A Current Testing Precision:±0.02% Primary Applications: Button Cell Testing Mobile Battery Testing Cylindrical Cell Testing Super-capacitor Testing Half-cell Testing and Materials Research Electrochemical Research and Development Key Features: GSM Testing DCIR Testing HPPC Testing Capacity Testing Cycle Life Testing Testing Data Analysis

Minimum Order: 1 bags

Contact:
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Fax:
Email:
Min Chen
+86-13728762680
+86-755-83109966
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Neware Technology Limited
22C,YHC Tower, No.1 Sheung Yuet Road, Kowloon Bay
HongKong
China
2/10/23 7:43 GMT
BTS5V12A Neware Battery Testing Equipment

Product Introduction: 1.Neware BTS5V12A battery testing equipment provides most applications in cylindrical cell and pouch cell capacity Testing.It based on charging discharging battery under different modes. It controlled by the Monitor Software installed at computer. Monitor software to edit testing program and BTSDA to analysis tested data. 2.Every unit BTS5V12A battery testing equipment has 8 channels and could be installed Max.10 units on a rack make up 80 channels.Each of channel could work independently with different charge discharge program at same time. 3.Neware battery testing equipment has constant current charge,constant voltage charge,constant current and voltage charge,constant power charge,constant current discharge,constant voltage discharge,constant power discharge,constant resistance discharge. 4.5V12A battery testing equipment widely used in Pouch Cell Testing,Mobile Battery Testing,Cylindrical Cell Testing,Production Line Testing,Super- capacitor Testing and Lab Battery Materials Research. 5.The Neware battery testing equipment is suitable for all kinds rechargeable batteries such as lithium battery, NI-MH battery, Zn-Mn watch battery and so on. Key Technology Parameters: Voltage Range:25mV~5V Lowest Discharge Voltage:1.5V Voltage Testing Precision:±0.05% Current Range 1:5mA~1A; Current Range 2:1A~6A; Current Range 3:6A~12A Current Testing Precision:±0.05% Primary Applications: Pouch Cell Testing 3C Batteries Testing Mobile Battery Testing Cylindrical Cell Testing Production Line Testing Super-capacitor Testing Lab Battery Materials Research Key Features: DCIR Testing Pulse Testing Capacity Testing Cycle Life Testing Testing Data Analysis Charge/Discharge Testing

Minimum Order: 1 bags

Contact:
Phone:
Fax:
Email:
Min Chen
+86-13728762680
+86-755-83109966
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Neware Technology Limited
22C,YHC Tower, No.1 Sheung Yuet Road, Kowloon Bay
HongKong
China
2/9/23 3:50 GMT
Internal Automatic Calibration System Digital Analytical Balance 90mm Pan

Internal Automatic Calibration System Digital Analytical Balance Single Precision Mass Sensor The visual appearance of the product is blent into the simple concept,stylish and generous.Specially makes the fine pouring cast-aluminium outer covering,so a to the enhance the balance of the anti-static anti-jamming capacity.The panel with five operational button,sliding glass windscreen provide big space,insightful vision and operate easily.We use high precision magnet sensor to keep the weighing more fast and stable. Weighing application mode: 1.Percent weighing function 2.Density weighing direct reading function 3. Animal weighing function 4. Set object weighing and counting function 5. Cost settlement function 6. Check weight function 7.Wool / Net / Skin weighing function 8.Peak hold function 9. Cumulative function Application: Laboratory, Industrial, Education, Retail, Food, Jewelry and specialty market. Maximum weighing 310 g Minimum reading 0.001 g Repeatability ±0.002< , br>g Linear error ±0.003 g Stable time ≤3 s Weighing pan size Φ90 mm Operating temperature 17.0~25.5 ℃ Calibration method 6.5 kg Net weight External calibration

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Ms. Liu
86-135-46943585
86-135-46943585
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Kunshan Scale Electronic Technology Co.,Ltd
Building 29-1 No. 888 Pengqing Road, Huaqiao Town, Kunshan City, Suzhou City, Jiangsu Province, China
Suzhou 215000
China
2/8/23 8:47 GMT
Speed Adjustable X-Ray Film Dryer Chip Induction Non Destructive Testing Eq

HDL-360 speed adjustable x-ray film dryer Technical parameters and specifications ● Drying process: → → Water washing → → Drying → → ● Film development speed: 40-240s adjustable ● Sheet feeding width:. 360 m ● Moving speed: 710mm/min (running time: 40 seconds) ● Dry tablet quantity 80X360mm (4 "X14") film 450 sheets per hour (dry film speed 40s) ● Power supply: 200-240V. 50/60Hz 5A ● Water consumption: 2 l/min during film operation ● Volume: 560mmX480mx545 (length x width x height) ● Add the function of chip induction ● Improved air duct, higher drying efficiency ● Roller shaft: DuPont foamed uranium is used to ensure that it will not harden within 5 years ● Shell: engineering PVC plastic ● Heating element: PTC heating element ● Temperature control mode: constant temperature control with solid-state relay ● Optional parts: water washing circulating device, which aims at no tap water, poor water quality or frequent water stoppage at the use site For Speed Adjustable X-Ray Film Dryer Chip Induction Non Destructive Testing Equipment 0

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Email:
Ms. Shifen Yuan
86-10-82921131
86-10-82916893
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HUATEC GROUP CORPORATION
7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096
BeiJing 100096
China
11/13/22 9:48 GMT
Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection

Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie- talkies, computers, etc. This product SCFE035 we will introduce is 0.35 mm in barrel diameter and 18 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms. The plunger can be pressed at a distance of up to 1.5 mm. But it is better to be pressed at a distance of 1 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1 mm, the loaded force is about 38 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 150 milliohms max Bandwidth: 9.3 GHz at -1dB Inductive Reactance: 1MHZ at -0.05517 uH Capacitive Reactance: 1MHZ at 0.462432 uF Specifications: Full Stroke: 1.5 mm Rated Stroke: 1 mm Spring Force: 38±11 gf at load 1 mm Mechanical Life: about 200000 cycles For more information, please check below catalog. Company Information: Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website centalic.com and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

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Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 9:42 GMT
High-Current Probe Pogo Pin P350(150) for Electronic Test

High-Current Probe Pogo Pin P350(150) for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(150)-H-14G(C) This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 50 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of SK4, then gold and nickel plated. The plunger tip is made of brass, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 20 amps, continuous Contact Resistance: 50 millohms, max Full Stroke: 7.5 mm Rated Stroke: 5 mm Spring Force: 397 gf at load 5 mm For more information, please check below catalog. Company Information: Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 9:24 GMT
Test Probe Pogo Pin PL50 Series for PCBA Inspection

Test Probe Pogo Pin PL50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in- circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: Diameter 0.95 mm Full Stroke: 3.7 mm Rated Stroke: 2.54 mm Spring Force: 28/56/85 gf (1/2/3 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu/SK4, Nickel Plated or Gold Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 9:21 GMT
Double-Ended Pogo Pin Test Probe SCFB029 (40) for Chip Inspection

Double-Ended Pogo Pin Test Probe SCFB029 (40) for Chip Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie- talkies, computers, etc. SCPB029(40) is unique in shape among semiconductor test probes due to a convex ring at one end of its barrel. Only the top plunger, which contacts the device under test, is movable. The bottom plunger, which contacts PCB, is fixed owing to the concave ring. This double-ended pogo pin can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 8.5 GHz at -1dB Inductive Reactance: 1MHZ at -0.02661uH Capacitive Reactance: 1MHZ at 0.925374uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.65 mm Spring Force: 14±4 gf at load 0.65 mm Mechanical Life: about 100000 cycles For more information, please check below catalog. Company Information: Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 9:13 GMT
High-Current Probe Pogo Pin P203 for Electronic Test

High-Current Probe Pogo Pin P203 for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P203. This probe can withstand the current up to 17 Amps. And its typical maximum contact resistance is 80 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of phosphor bronze. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of beryllium copper, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 17 amps, continuous Contact Resistance: 80 milliohms, max Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 115 gf (4 oz) at load 4.3 mm For more information, please check below catalog. Company Information: Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 8:54 GMT
PCBA Test Probe Pogo Pin PC75 Series Applied to ICT

PCBA Test Probe Pogo Pin PC75 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in- circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PC75 series here. Its test center is 75 mil. The diameter is 1.91 mm and the total length is 33.1 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 6.4 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.4 oz)/200 gf (7.2 oz)/280 (10 oz)/330 gf (12 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: SK4, Nickel Plated or Gold Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 8:51 GMT
Double-ended Pogo Pin Test Probe SCPC026 for Integrated Circuit Inspection

Double-ended Pogo Pin Test Probe SCPC026 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie- talkies, computers, etc. This product SCPC026 we will introduce is 0.26 mm in barrel diameter and 5.3 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 0.8 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 21 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph/SP, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 7.7 GHz at -1dB Inductive Reactance: 1MHZ at -0.07638 uH Capacitive Reactance: 1MHZ at 0.332478 uF Specifications: Full Stroke: 0.8 mm Rated Stroke: 0.5 mm Spring Force: 21±6 gf at load 0.5 mm Mechanical Life: about 100000 cycles For more information, please check below catalog. Company Information: Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website centalic.com and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong
11/13/22 8:21 GMT
In-circuit Test Probe Pogo Pin PE50 for PCBA Inspection

In-circuit Test Probe Pogo Pin PE50 for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in- circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE50 series here. Its test center is 50 mil. The diameter is 1.27 mm and the total length is 43.2 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, CRW and SW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.4 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.5 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Nickel Plated or Gold Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big- current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Minimum Order: 100

Contact:
Phone:
Fax:
Email:
Stella
+85252857123

Send Inquiry
Centalic Technology Development Ltd.
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong.
Hong Kong
Hong Kong


SOURCE: Import-Export Bulletin Board (https://www.imexbb.com/)
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