Interface Probe Test Pin IFP-001 Used for Transmitting Electrical Signals

Interface Probe Test Pin IFP-001 Used for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a
role in connection or control in switching functions, etc. Interface probes are
used for transmitting electrical signals from one end to the other end in test
fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003,
004, 005, 006 and 007 in IFP series. This product, IFP-001, is made from phosphor
bronze or brass, plated with gold. Characterized by excellent conductivity, it is
usually used for the connection of electronic components and functional tests.

IFP-001 interface probe is 14.22 mm in total length. If customers wish to change
its length or diameter, we could do as required. This probe is unique in shape. It
is straight whereas others, for example 002, 003, 004, 005, 006, 007, have an extra
base at the end. If the gold plating is expected to be thicken or thinned, we could
try to do according to requirements. Customization is welcome.

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include
semiconductor test probes, in-circuit test probes, radio frequency probes, harness
probes, battery contact probes, switching probes, big-current probes, spring
probes, universal complex test probes, wafer probes, and so on. They are widely
applied to the tests of various electronic products, such as in-circuit tests of
semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Minimum Order: 100 pieces

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